Reflectance Evaluation System MCPD series -OTSUKA ELECTRONICS CO.,LTD.

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The best system corresponding to the purpose is offered.

MCPD systems(MCPD-3700 / MCPD-7700 / MCPD-5000 / MCPD-N500) Provide optimum system solution for optical measurement to meet customer’s technical requirement based on fiber, software and optional units.

MCPD DETECTOR MAIN BODY	Wavelength range
MCPD-3700: Standard version	220 ~ 1000 nm
MCPD-7700: High sensitivity version	220 ~ 1100 nm
MCPD-5000: NIR version	900 ~ 1600 nm
MCPD-N500: NIR version	1100 ~ 2500 nm

Evaluation of surface property of optical and recording materials
Evaluation of reflection property of glass
Evaluation of reflection property of AR film

■ System configuration
Reflection Evaluation of characteristics
(1) MCPD detector main body
(2) Y-shaped fiber
(3) Light source

Reflection Evaluation of characteristics
(1) MCPD detector main body
(2) Light receiving fiber
(3) Angle-change unit
(4) Light source
(5) Light projection fiber

■ Measurement example

Reflectance of AR Coated on CRT

Organic OPC film,Inorganic selenium film,amorphous silicon film

■ System configuration
Photosensitive Drum Film Thickness Measurement

(1) MCPD detector main body
(2) Y-shaped fiber
(3) X-Y-θstage
(4) Light source

■ Measurement example

Change in Thickness at Each Measuring Point on Photosensitive Drum

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