Retardation Inspection System RETS-100 -OTSUKA ELECTRONICS CO.,LTD.

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Precise measurement of micro retardation (0.1nm or more)

Optimal for evaluating polarization properties of optical films, including evaluation of retardation wavelength dispersion and automatic detection of the orientation angle (optical axis) and the lamination angle.

A multichannel spectral photometer is used for the detector to support highly precise retardation measurement at an arbitrary wavelength.

Selecting inclined or rotational stages (options) provides for evaluation of viewing-angle characteristics including three-dimensional refractive index parameter analysis.

Supports construction of a flexible sample stage according to the measured object.

Retardation Inspection System RETS-100　　Retardation Measurement System MCPD series

Wavelength dispersion of retardation

Cell gap

Detection of aligment angle(optical axis)

Azimuth, ellipticity, polarization

Transmittance

Chromaticity

3-D refractive index parameter

■ Polarization measurement of optical film
　・Retardation film,Retardation plate
　・Polarizing film,Function added polarizing film,Polarizing plate
■ Polarizing measurement of LC material and LC cell
　・Optical parts for polarizing light
　・TN,STN,IPS,VA,OCB

Sample size		Min. 20×20mm - Max.100×100 （Thickness：2.5mm or less）
Retardation measuring range	Rotating analyzer method	Approx.0nm to Severel μm
	Light interference method	Approx.450nm to Severel μm
Detector		Multichannel spectrophotometer
Wavelength range		400 - 800nm
Measurement spot		φ1, φ2, φ5, φ10mm
Optical unit		Polarizing optics Gran-tomson prism of extinction ratio 10-5 Automatic rotation(Angle accuracy 0.1°) Automatic loading/unloading
Light source		100W Halogen lamp
Power supply		AC100V±10V、1.5kVA
Externals size and Weight		540(W)×580（D）×1000(H), Approx.60kg

■ Incident angle dependency of retardation
■ 3-D refractive index parameter

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