OLED Optical Characteristic Inspection System -OTSUKA ELECTRONICS CO.,LTD.

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OLED Optical Characteristic Inspection System

An inspection system based on a spectral luminance photometer [ Multichannel Photodetector System (MCPD-7000) and a spectral luminance attachment]

Lighting driven by direct current. Optimal for comprehensive evaluation of EL devices including measurements of luminance, chromaticity, L-I-V characteristics, emission efficiency, and external quantum efficiency.

OLED Panel Lifetime Evaluation System

Luminance(cd/m2)

Current Emission Efficiency(cd/A)

Emission Efficiency(lm/W)

Spectrum

Contrast Ratio

Chromaticity

External Quantum Efficiency

L-I-V

■ OLED device

Sample size		250 × 250 mm
Manual sample stage		XY axis 　±50 mm (Manual) Z axis　　±10 mm (Upper),-50 mm (Lower)
Detector (MCPD-7000)	Wavelength Range	380 ~780 nm
	Detector	Electro cooling CCD image sensor 512ch
	wavelength accuracy	±0.5 nm
Luminance attachment	Measurement Angle	2°，1°，0.2°，0.1°
	Luminance range	0.2 ～ 9.7×105 cd/m2
Other components		Color monitor TV,Power supply for LED
Data processing unit		PC computer(PC/AT compatible),monitor,printer

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